• Chinese Optics Letters
  • Vol. 13, Issue Suppl., S22206 (2015)
Ruigang Li*
Author Affiliations
  • Key Laboratory of Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics, and Physics, Chinese Academy of Sciences, Changchun 130033, China
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    DOI: 10.3788/COL201513.S22206 Cite this Article Set citation alerts
    Ruigang Li. Measurement method for the eccentricity of an off-axis asphere with a laser tracker[J]. Chinese Optics Letters, 2015, 13(Suppl.): S22206 Copy Citation Text show less
    Schematic of null compensating interferometry.
    Fig. 1. Schematic of null compensating interferometry.
    Diagram of the testing procedure.
    Fig. 2. Diagram of the testing procedure.
    Sketch of the eccentricity measurement layout.
    Fig. 3. Sketch of the eccentricity measurement layout.
    Photograph of an eccentricity measurement.
    Fig. 4. Photograph of an eccentricity measurement.
    ItemErrorRemark
    Cylindricity of Compensatore1<0.0100mm
    Eccentricity of Compensatore2<0.0100mm
    Deflection of Compensator<5, so e3<L*tan(5)=0.1818mm
    Flatness of Aspheree4<0.0100mm
    Laser TrackerDistance accuracy: e5=2μm+L*0.4μm/m=0.0050mm; Angle accuracy: e6=10μm+L*2.5μm/m=0.0288mmFARO (ION), interferometer), distance accuracy and angle accuracy are all typical values
    Totale=Σi=16ei2=0.1859mmRoot-sum squared (RSS) of individual errors.
    Table 1. Uncertainty Analysis
    Ruigang Li. Measurement method for the eccentricity of an off-axis asphere with a laser tracker[J]. Chinese Optics Letters, 2015, 13(Suppl.): S22206
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