• Laser & Optoelectronics Progress
  • Vol. 58, Issue 9, 0900005 (2021)
Mingbin Cui1, Jungang Huang2, and Xiulun Yang1、*
Author Affiliations
  • 1School of Information Science and Engineering, Shandong University, Qingdao , Shandong 266237, China
  • 2Guangdong Raying Laser Technology Co. Ltd., Dongguan , Guangdong 523808, China
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    DOI: 10.3788/LOP202158.0900005 Cite this Article Set citation alerts
    Mingbin Cui, Jungang Huang, Xiulun Yang. Review on Methods for Laser Linewidth Measurement[J]. Laser & Optoelectronics Progress, 2021, 58(9): 0900005 Copy Citation Text show less
    Relationship among beat frequency signals processed by different methods
    Fig. 1. Relationship among beat frequency signals processed by different methods
    System principle diagram of double beam heterodyne method
    Fig. 2. System principle diagram of double beam heterodyne method
    Experimental device for linewidth measurement [16]
    Fig. 3. Experimental device for linewidth measurement [16]
    Principle structural diagram of delayed self-zero heterodyne method
    Fig. 4. Principle structural diagram of delayed self-zero heterodyne method
    Delayed nonzero self-heterodyne method based on Mach-Zehnder interferometer
    Fig. 5. Delayed nonzero self-heterodyne method based on Mach-Zehnder interferometer
    Principle structural diagram of delayed self-heterodyne method based on Michelson interferometer
    Fig. 6. Principle structural diagram of delayed self-heterodyne method based on Michelson interferometer
    Principle structural diagram of delayed self-heterodyne method with cyclic gain compensation [19]
    Fig. 7. Principle structural diagram of delayed self-heterodyne method with cyclic gain compensation [19]
    Cyclic auto-heterodyne linewidth measurement system based on Michelson interferometer[22]
    Fig. 8. Cyclic auto-heterodyne linewidth measurement system based on Michelson interferometer[22]
    Experimental structural diagram [24]
    Fig. 9. Experimental structural diagram [24]
    Schematic of experimental device [28]
    Fig. 10. Schematic of experimental device [28]
    Principle diagram of experimental device [31]
    Fig. 11. Principle diagram of experimental device [31]
    Delayed fiber lengths and corresponding ΔS for different prediction linewidths[31]
    Fig. 12. Delayed fiber lengths and corresponding ΔS for different prediction linewidths[31]
    Principle diagram of laser linewidth measurement[32]
    Fig. 13. Principle diagram of laser linewidth measurement[32]
    Relationship between prediction linewidth and k[33]. (a) k10; (b) k0.1
    Fig. 14. Relationship between prediction linewidth and k[33]. (a) k<10; (b) k<0.1
    Principle structural diagram of DSHI with second-order Stokes light as reference light[34]
    Fig. 15. Principle structural diagram of DSHI with second-order Stokes light as reference light[34]
    System structural diagram of cross correlation method for laser linewidth measurement [36]
    Fig. 16. System structural diagram of cross correlation method for laser linewidth measurement [36]
    Frequency noise distribution and β-separation line[38]
    Fig. 17. Frequency noise distribution and β-separation line[38]
    Principle structural diagram of unbalanced optical fiber interferometer measurement method[39]
    Fig. 18. Principle structural diagram of unbalanced optical fiber interferometer measurement method[39]
    Simulated SLωB,τd power spectra [20]
    Fig. 19. Simulated SLωB,τd power spectra [20]
    Simulated 1f noise spectra under different time delays[52]
    Fig. 20. Simulated 1f noise spectra under different time delays[52]
    Voigt spectra under different Gaussian and Lorentz spectral widths [52]
    Fig. 21. Voigt spectra under different Gaussian and Lorentz spectral widths [52]
    Frequency variation caused by typical mechanical noise [10]
    Fig. 22. Frequency variation caused by typical mechanical noise [10]
    Measurement position /dBFull width of beat spectral line
    -3[2Δv]
    -10[29Δv]
    -20[299Δv]
    -30[2999Δv]
    Table 1. Linewidth relationship in DSHI linewidth measurement
    Δfest(kHz)Delaying length (m)ΔS(dB)Δf(kHz)
    0.1500021.980.15
    2.5100017.112.30
    1050014.319.10
    2030013.5018.20
    1505012.98125
    4501512.78430
    Table 2. Δf and ΔS for different predicted linewidth and delaying fiber lengths[31]
    MethodMeasurement accuracyAdvantageDisadvantage
    Double beam heterodyne methodDependent only on reference light width[11,16]High frequency band, high resolution, high sensitivityNeed of reference laser with narrow linewidth close to measured laser frequency, two beat frequency beams continuously, stably and precisely controlled in a very small range, high requirements for experimental instruments and environment, narrow application range
    Dynamic linewidth measurement technology based on digital coherent receiverAvailable measurement of both dynamic linewidth and static linewidth, obvious advantages in detecting tunable DSDBR laser linewidth and evaluating performance of tunable laser in high-speed coherent communication systemNo obvious advantages in static line width measurement
    Delayed self-zero heterodyne method[57-59]>1 kHz[12,15,20]No need of acousto-optic modulator, reduced cost, small loss of output optical power, increased sensitivity,being conducive to circuit integrationNear-zero-frequency operation, being easy to be affected by surrounding environment, not being easy to read line width directly
    Delayed nonzero heterodyne method based on Mach- Zehnder interferometer[40,60-62]Being able to read both half height and full width of beat frequency signal intuitively, no need of high stability reference sourceLong time delay optical fiber needed, Rayleigh scattering and loss introduced to bring inconvenience to measurement, high requirements for anti-interference ability of system, insertion loss introduced using acousto-optic frequency shifter
    Delayed nonzero heterodyne method based on Michelson interferometerLength of delayed optical fiber halved, Faraday rotating mirror (FRM) directly connected at reflection end [63-65], independent of polarization, accuracy improvedMore complex structure, fiber with large loss
    Cyclic gain compensation delayed self-heterodyne method[66]Length of optical fiber and cost greatly reducedInsertion loss introduced into acousto-optic frequency shifter, poor stability of polarization state in system, high optical loss
    DSHI generated by Brillouin ring laser using second-order Stokes light as reference light<100 kHz[34]Very small lower limit of laser measurement, high measurement accuracy, simple structure, less optical devices used , no need of long fiber, wide measurement band, and measurement not limited by pump light wavelength and in a wide spectral rangeBeing impossible to measure wide laser linewidth, being necessary to keep ambient temperature constant to ensure single longitudinal mode operation [67-68]
    Ultra-narrow linewidth measurement based on Voigt profile fitting>10 Hz[24]Spectral broadening effect by 1/f frequency noise and Lorentzian line shape from measured spectra ignored, high resolutionComplicated calculation
    High-precision narrow laser linewidth measurement based on coherent envelope demodulation>1 kHz[28]Gaussian broadening effect by 1/f frequency noise ignoredComplicated iterative process
    Characterization of linewidth by autocorrelation detection using strong coherent envelope>1 kHz[31]Short fiber length required, near center-frequency of CDSPST value, minimum detection error, high frequency stability, high accuracyInconvenience measurement due to polarization state and loss introduced by acousto-optic frequency shifter
    Measurement method based on unbalanced optical fiber interferometer>1 kHz[39]Simple structure of system, simple operation, no need of long delayed fiber, less application of acousto-optic modulator, high measurement accuracy, no need of Lorentz fittingHigh requirement of interferometer for surrounding environment, being easy to introduce random errors, repeated measurements needed for average
    Narrow-band laser linewidth measurement based on cross-correlation method and β algorithm>20 Hz[36]Lot of system noise eliminated using cross-correlation principle, linewidth information more accurately captured, no need of Lorentz fitting, small experimental errors, linewidth of 2 μm band measuredComplex algorithm, associated noises in system not eliminated
    Ultra-narrow linewidth measurement based on two parameter acquisition with partially coherent light interference>100 Hz and <100 kHz[32]Influence of 1/f noise reduced using optical fiber with kilometer level long delay, no influence of fiber length, small measurement errorsScattering loss and 1/f noise introduced by acousto-optic frequency shifter and time-delay fiber, which limiting improvement of measurement accuracy, not being suitable for wide linewidth measurement
    Table 3. Summary and comparison of methods for linewidth measurement
    Mingbin Cui, Jungang Huang, Xiulun Yang. Review on Methods for Laser Linewidth Measurement[J]. Laser & Optoelectronics Progress, 2021, 58(9): 0900005
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