• Opto-Electronic Engineering
  • Vol. 38, Issue 2, 65 (2011)
ZENG Luan1、2, ZHAI You2, and TAN Jiu-bin1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    ZENG Luan, ZHAI You, TAN Jiu-bin. Automatic Matching Strategy Based on SIFT[J]. Opto-Electronic Engineering, 2011, 38(2): 65 Copy Citation Text show less

    Abstract

    For the purpose of actualizing automatic image matching, a new Scale Invariant Feature Transform (SIFT) matching strategy is presented. Firstly, compared with the given basal ratio of Euclidean distance from the closest neighbor to the distance of the second closest of features, the coarse matching collection of SIFT is obtained. Then, obtain the histogram of coarse matching corresponding points’ main direction angle differences and the histogram of minimum Euclidean distances. The precise matching is taken under the conditions that the main direction angle differences fall into the neighborhood of histogram’s peak value. And the minimum Euclidean distance is smaller than the corresponding distance of histogram’s main peak. Finally, obtain the histogram of precise matching corresponding points’ ratio. The false matching is eliminated under the conditions that the ratio of Euclidean distance from the closest neighbor to the distance of the second closest is smaller than the corresponding ratio of histogram’s main peak. The experimental results prove that the proposed method is stable and reliable even if the image has some view point, illumination, rotation and scale variation. The proposed method can select the matching threshold automatically without manual intervention.
    ZENG Luan, ZHAI You, TAN Jiu-bin. Automatic Matching Strategy Based on SIFT[J]. Opto-Electronic Engineering, 2011, 38(2): 65
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