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    Journals >Opto-Electronic Engineering >Volume 32 >Issue 6 >Page 79 > Article
    • Opto-Electronic Engineering
    • Vol. 32, Issue 6, 79 (2005)
    [in Chinese]
    [in Chinese] and [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(6): 79 Copy Citation Text show less
    References

    [3] ZHANG Lei, BAO Paul. Edge detection by scale multiplication in wavelet domain [J]. Pattern recognition letters,2002,23:1771-1784.

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    [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(6): 79
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