• Acta Optica Sinica
  • Vol. 44, Issue 8, 0826001 (2024)
Yuan Su, Ailing Tian*, Hongjun Wang, Bingcai Liu, Xueliang Zhu, Siqi Wang, Kexin Ren, and Yuwen Zhang
Author Affiliations
  • Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, School of Opto-electronical Engineering, Xi’an Technological University, Xi’an 710021, Shaanxi , China
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    DOI: 10.3788/AOS231903 Cite this Article Set citation alerts
    Yuan Su, Ailing Tian, Hongjun Wang, Bingcai Liu, Xueliang Zhu, Siqi Wang, Kexin Ren, Yuwen Zhang. Measurement Method of Aspherical Synchronous Annular Subaperture Interferometry[J]. Acta Optica Sinica, 2024, 44(8): 0826001 Copy Citation Text show less
    Schematic of SASI method to detect aspherical surface
    Fig. 1. Schematic of SASI method to detect aspherical surface
    Lightpath diagram of aspherical surface test using SASI method
    Fig. 2. Lightpath diagram of aspherical surface test using SASI method
    Lightpath model of aspheric test using SASI method
    Fig. 3. Lightpath model of aspheric test using SASI method
    Simulated interferograms and changing rate curves of OPD. (a) Simulated interferogram by interferometer; (b) changing rate of OPD measured by interferometer; (c) simulated interferogram by SASI method; (d) changing rate of OPD measured by SASI method
    Fig. 4. Simulated interferograms and changing rate curves of OPD. (a) Simulated interferogram by interferometer; (b) changing rate of OPD measured by interferometer; (c) simulated interferogram by SASI method; (d) changing rate of OPD measured by SASI method
    Measurement data before and after unifying the reference standard. (a) Before unifying the reference standard; (b) after unifying the reference standard
    Fig. 5. Measurement data before and after unifying the reference standard. (a) Before unifying the reference standard; (b) after unifying the reference standard
    Actual surface error and aspherical surface error and residual measured by SASI method. (a) Actual surface error; (b) surface error measured by SASI method; (c) surface residual by SASI method
    Fig. 6. Actual surface error and aspherical surface error and residual measured by SASI method. (a) Actual surface error; (b) surface error measured by SASI method; (c) surface residual by SASI method
    Schematic of actual measuring system
    Fig. 7. Schematic of actual measuring system
    Collected interferograms in the experiment. (a) Aspherical surface measuring by interferometer; (b) aspherical surface measuring by SASI method
    Fig. 8. Collected interferograms in the experiment. (a) Aspherical surface measuring by interferometer; (b) aspherical surface measuring by SASI method
    Testing results of aspheric surface. (a) Testing result by SASI method; (b) testing result by Luphoshcan method; (c) residual between test results of SASI and Luphoscan methods
    Fig. 9. Testing results of aspheric surface. (a) Testing result by SASI method; (b) testing result by Luphoshcan method; (c) residual between test results of SASI and Luphoscan methods
    Parameterl /mmG1(x, y)G2(x, y)R1 /mmR2 /mm
    Value0.8(1.9, 30.7)(3.2, 40.0)251.9252.7
    Table 1. Distance between two focuses of bifocal lens and corresponding detection area parameters
    ParameterWavelength /nml /mmGlassG1(x, y)G2(x, y)
    Value632.80.7F_SILICA(1.7, 32.6)(3.7, 48.3)
    Table 2. Bifocal lens design parameters and corresponding detection area parameters
    ParameterPV /λRMS /λ
    Surface by SASI0.62370.0333
    Surface by Luphoshcan0.58750.0424
    Absolute surface error0.03620.0091
    Residual surface error0.09260.0098
    Table 3. Results of SASI and Luphoshcan methods and the PV and RMS values of surface error
    Yuan Su, Ailing Tian, Hongjun Wang, Bingcai Liu, Xueliang Zhu, Siqi Wang, Kexin Ren, Yuwen Zhang. Measurement Method of Aspherical Synchronous Annular Subaperture Interferometry[J]. Acta Optica Sinica, 2024, 44(8): 0826001
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