• Acta Optica Sinica
  • Vol. 18, Issue 4, 486 (1998)
[in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]2, [in Chinese]2, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement and Calculation of Anisotropic Polymer Film Parameters[J]. Acta Optica Sinica, 1998, 18(4): 486 Copy Citation Text show less
    References

    [1] R. Ulrich. Theory of the prism-film coupler by plane-wave analysis. J. Opt. Soc. Am., 1970, 60(10): 1337~1350

    [2] Tie-Nan Ding, E. Garmire. Measurement of thin film parameters using substrate excitation of leaky modes. Opt. Commun., 1983, 48(2): 113~115

    [3] Tie-Nan Ding, E. Garmire. Measuring refractive index and thickness of thin films: A new technique. Appl. Opt., 1983, 22(20): 3177~3181

    [4] R. Ulrich, R. Torge. Measurement of thin film parameters with a prism coupler. Appl. Opt., 1973, 12(12): 2901~2908

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement and Calculation of Anisotropic Polymer Film Parameters[J]. Acta Optica Sinica, 1998, 18(4): 486
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