• Acta Optica Sinica (Online)
  • Vol. 1, Issue 3, 0314001 (2024)
Shuming Yang*, Xing Qu, and Chunyang Ma
Author Affiliations
  • State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University,Xi’an 710054, Shaanxi , China
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    DOI: 10.3788/AOSOL240432 Cite this Article Set citation alerts
    Shuming Yang, Xing Qu, Chunyang Ma. Review of Event Camera-Based Visual Measurement (Invited)[J]. Acta Optica Sinica (Online), 2024, 1(3): 0314001 Copy Citation Text show less
    DVS chip circuit diagram
    Fig. 1. DVS chip circuit diagram
    DVS output circuit diagram
    Fig. 2. DVS output circuit diagram
    Examples of 9×11 calibration patterns
    Fig. 3. Examples of 9×11 calibration patterns
    Pattern change process of blinking method[42]
    Fig. 4. Pattern change process of blinking method[42]
    Event frame examples of the motion method[42]
    Fig. 5. Event frame examples of the motion method[42]
    Trajectory of a marker point[42]
    Fig. 6. Trajectory of a marker point42
    Structured light measurement model. (a) Principle of dot structured light; (b) principle of line structured light
    Fig. 7. Structured light measurement model. (a) Principle of dot structured light; (b) principle of line structured light
    Laser stripe shown by image and event pipeline. (a) Gray value distribution of light stripe; (b) events triggered by vibration; (c) light stripe event frame
    Fig. 8. Laser stripe shown by image and event pipeline. (a) Gray value distribution of light stripe; (b) events triggered by vibration; (c) light stripe event frame
    Planar array structured light model. (a) Principle of surface structured light measurement; (b) principle of disparity model
    Fig. 9. Planar array structured light model. (a) Principle of surface structured light measurement; (b) principle of disparity model
    DLP projection pattern. (a) Multi-frequency heterodyne pattern; (b) digital speckle pattern
    Fig. 10. DLP projection pattern. (a) Multi-frequency heterodyne pattern; (b) digital speckle pattern
    Ref.HardwarePrecision (RMSE)
    50

    DVS128;

    laser LC-LML-635

    2 mm@0.45 m
    49

    DVS128;

    laser SHOWWX

    12.68 mm@500 mm
    58

    DAVIS240C;

    laser FU850AD100

    1.2 mm@500 mm
    57

    CeleX-V;

    DLP 6500

    0.27 mm@70 mm
    59

    Prophesee Gen3S1.1;

    projector MP-CL1A

    4.6 mm@500 mm
    47

    Prophesee SilkyEvCam;

    projector MP-CL1A

    6.14 mm@1228 mm
    60

    DAVIS346;

    projector LightCrafter 4500

    3.45 mm@100 mm
    Table 1. Comparison of parameters for existing event camera structural light system
    Shuming Yang, Xing Qu, Chunyang Ma. Review of Event Camera-Based Visual Measurement (Invited)[J]. Acta Optica Sinica (Online), 2024, 1(3): 0314001
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