Identification of X-ray spectral lines in high-charged laser-producde Ge plasma

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 10 >Issue 7 >Page 587 > Article

Acta Optica Sinica
Vol. 10, Issue 7, 587 (1990)

Identification of X-ray spectral lines in high-charged laser-producde Ge plasma

[in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Identification of X-ray spectral lines in high-charged laser-producde Ge plasma[J]. Acta Optica Sinica, 1990, 10(7): 587 Copy Citation Text

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Abstract

With the calculated oscillator strengths of Na-, Ne-, F- and O- like Ge ions, over forty lines (λ= 6-10A) of laser-produced Ge plasma taken by a plate crystal spectrograph have been identified.

Keywords

oscillator strenth X-ray spectral lines of laser plasma

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