• Opto-Electronic Engineering
  • Vol. 38, Issue 7, 64 (2011)
WANG Yi, CHENG Da-lin, REN Yong-jie, and YE Sheng-hua
Author Affiliations
  • [in Chinese]
  • show less
    DOI: 10.3969/j.issn.1003-501x.2011.07.012 Cite this Article
    WANG Yi, CHENG Da-lin, REN Yong-jie, YE Sheng-hua. Transmission Laser-scanning Diameter Inspection Technology[J]. Opto-Electronic Engineering, 2011, 38(7): 64 Copy Citation Text show less
    References

    [1] TAO Lei,,LI Xin-qiu,ZHANG Li-sheng. A New Computational Method in Laser Scanning Measurement of Diameter [J].

         NDT,2007,29(7):386-388.

    [2] WANG Bin,LI Xin-qiu,ZHANG Li-sheng,et al. Design of a Data Acquisition System Used in Laser Scanning Diameter Measuring Gauge [J]. Control and Automation(Measurement & Control),2007,23(7):106-108.

    [3] SONG Jia-wu,ZHANG Guo-yu,XU Hong-ji,et al. A Laser-scanned On-line Dynamic Measuring System for Large Diameters [J]. Acta Armamentaria,2000,21(2):132-134.

    [4] ZHANG G Y,XU X P,FU X H,et al. The Measurement and Control of Diameter in Large-scale Part Processing [J]. Journal of Materials Processing Technology (S0924-0136),2002,129:653-657.

    [5] SUN Chang-ku,YE Sheng-hua. Laser Measurement Technology [M]. Tianjin:Tianjin University Press,2001:154-157.

    [6] XU Xi-ping,ZHANG Guo-yu,AN Zhi-yong,et al. A Reflection Laser-scanned Inspection System [J]. Acta Armamentaria, 2002,23(4):341-343.

    [7] MA Guo-xin. Laser Scanning System for Diameter Measuring of which Scanning Object Lens Are Free [J]. Laser Journal, 2006,27(1):26-28.

    [8] MA Guo-xin,FAN Duo-wang. Laser Differential Scanning for Diameter Measuring [J]. China Measurement Technology, 2005,31(4):17-19.

    [9] MA Guo-xin. Laser Scanning System for Diameter Measurement [J]. Opto-Electronic Engineering,2004,31(2):44-47.

    [10] MA Guo-xin. Measurement of FWHM for Gaussian Beam Distribution with Photoelectric-Conjugate Method [J]. Opto-Electronic Engineering,2003,30(3):46-48.

    WANG Yi, CHENG Da-lin, REN Yong-jie, YE Sheng-hua. Transmission Laser-scanning Diameter Inspection Technology[J]. Opto-Electronic Engineering, 2011, 38(7): 64
    Download Citation