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Journals >Opto-Electronic Engineering >Volume 32 >Issue 3 >Page 36 > Article

Opto-Electronic Engineering
Vol. 32, Issue 3, 36 (2005)

[in Chinese]

[in Chinese]^1、2, [in Chinese]¹, [in Chinese]¹, and [in Chinese]¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(3): 36 Copy Citation Text

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References

[2] REIMANN D A,JACOBS H A,SAMEI E. Use of Wiener filtering in the measurement of the two-dimensional modulation transfer function[J]. SPIE,2000,3977:670-680.

[3] BOREMAN G D. Transfer function in optical and electro-optical systems[M]. Bellingham:SPIE,2001.

[4] LEGER D,DUFFAUT J,ROBINET F. MTF measurement using spotlight[A]. Proceedings of the 1994 International Geoscience and Remote Sensing Symposium [C]. Pasadena,USA:IEEE,1994,4:2010-2012.

[5] OPTIKOS Corporation. How to measure MTF and other properties of lenses[EB/OL]. www.Optikos.com/classes/ pdfs/how_to_measure_mtf.pdf,1999-07-16.

[6] FLYNT W E. Measurment of modulation transfer function in image tubes:effects of spurious background brightness[J]. SPIE,1993,1952:276-280.