• Acta Optica Sinica
  • Vol. 25, Issue 4, 465 (2005)
[in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Numerical Analysis of Interaction and Perturbation between Evanescent Field and Probe in Optical Field Detection by SNOM[J]. Acta Optica Sinica, 2005, 25(4): 465 Copy Citation Text show less
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    [2] D. Courjon, C. Bainier. Near field microscopy and near field optics[J]. Rep. Prog. Phys., 1994, 57: 989~1028

    [3] Douglas A. Christensen. Analysis of near field tip patterns including object interaction using finite-difference time-domain calculations[J]. Ultramicroscopy, 1995, 57: 189~195

    [4] O. J. F. Martin. 3D simulations of the experimental signal measured in near-field optical microscopy[J]. J. Microscopy, 1999, 194:235~239

    [5] Hiromitsu Furukawa, Satoshi Kawata. Analysis of image formation in a near-field scanning optical microscope effects of multiple scattering[J]. Opt. Commun., 1996, 132: 170~178

    [6] Kazuo Tanaka, Masahiro Tanaka, Takahiro Yoshida et al.. Numerical simulations of near field optics by boundary and volume integral equation methods[C]. Proc. Ⅷ-th International Conference on Mathematical Methods in Electromagnetic Theory, Kharkov, Ukraine, 2000. 47~53

    [7] Hiromitsu Furukawa, Satoshi Kawata. Near-field optical microscope images of a dielectric flat substrate with subwavelength strips[J]. Opt. Commun., 2001, 196: 93~102

    [9] Kane S. Yee, Numerical solution of initial boundary value problems involving maxwell′s equations in isotropic media[J]. IEEE Trans. Antennas Propagat., 1966, 14(8): 302~307

    CLP Journals

    [1] Yan Feng, Zhou Ming, Fan Xiaomeng, Zhang Wei. Near-Field Nanofabrication Technology Base on Local Field Enhancement Effect[J]. Acta Optica Sinica, 2008, 28(s1): 176

    [2] Wang Zhao, Wu Shifa, Li Hong, Liu Kun. Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination[J]. Acta Optica Sinica, 2010, 30(8): 2272

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Numerical Analysis of Interaction and Perturbation between Evanescent Field and Probe in Optical Field Detection by SNOM[J]. Acta Optica Sinica, 2005, 25(4): 465
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