Journals
Advanced Photonics
Photonics Insights
Advanced Photonics Nexus
Photonics Research
Advanced Imaging
View All Journals
Chinese Optics Letters
High Power Laser Science and Engineering
Articles
Optics
Physics
Geography
View All Subjects
Conferences
CIOP
HPLSE
AP
View All Events
News
About CLP
Search by keywords or author
Login
Registration
Login in
Registration
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
metasurface
laser
polarization
nir
lithium niobate
optical coherence tomography
Journals >
Laser & Optoelectronics Progress >
Volume 57 >
Issue 6 >
Page 061011 > Article
Laser & Optoelectronics Progress
Vol. 57, Issue 6, 061011 (2020)
Image Dehazing Method Based on Dark Channel Compensation and Improvement of Atmospheric Light Value
Qiang Gao, Liaolin Hu
*
, and Xin Chen
Author Affiliations
School of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, Xi'an, Shaanxi 710048, China
show less
DOI:
10.3788/LOP57.061011
Cite this Article
Set citation alerts
Qiang Gao, Liaolin Hu, Xin Chen. Image Dehazing Method Based on Dark Channel Compensation and Improvement of Atmospheric Light Value[J]. Laser & Optoelectronics Progress, 2020, 57(6): 061011
Copy Citation Text
EndNote(RIS)
BibTex
Plain Text
show less
Cited By
Article index updated: May. 18, 2024
Citation counts are provided from Researching.
The article is cited by
4
article(s) from Researching.
Abstract
Get PDF(in Chinese)
Figures&Tables (10)
Equations (0)
References (11)
Cited By (4)
Get Citation
Copy Citation Text
Qiang Gao, Liaolin Hu, Xin Chen. Image Dehazing Method Based on Dark Channel Compensation and Improvement of Atmospheric Light Value[J]. Laser & Optoelectronics Progress, 2020, 57(6): 061011
Download Citation
EndNote(RIS)
BibTex
Plain Text
Set citation alerts for the article
Tools
Share
Set citation alerts for the article
Save the article for my favorites
Paper Information
Category: Image Processing
Received: Jul. 25, 2019
Accepted: Aug. 28, 2019
Published Online: Mar. 5, 2020
The Author Email: Hu Liaolin (huliaolin@163.com)
DOI:
10.3788/LOP57.061011
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology
Set citation alerts for the article
Please enter your email address
Cancel
Confirm