• Opto-Electronic Engineering
  • Vol. 43, Issue 2, 22 (2016)
ZENG Hengliang1、2、3、*, ZHANG Mengwei1、2, LIU Zheng1、3, and XIE Zongliang1、2、3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2016.02.004 Cite this Article
    ZENG Hengliang, ZHANG Mengwei, LIU Zheng, XIE Zongliang. Experiment of Target Detection Based on Polarization Imaging Using Polarization Parameter[J]. Opto-Electronic Engineering, 2016, 43(2): 22 Copy Citation Text show less
    References

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    [3] James McCarthy,Mark Woolley,Luz Roth. Correlation of environmental data measurements with polarimetric LWIR senor measurements of manmade objects in natural clutter [C]// Polarization:Measurement,Analysis,and Remote Sensing IX, Orlando,Florida,USA,April 7-8,2010,7672:76720M1-12.

    [4] Scott Tyo J,Charles F La Casse,Bradley M Ratliff. Total elimination of sampling errors in polarization imagery obtained with integrated microgrid polarimeters [J]. Optics Letters(S0146-9592),2009,34(20):3187-3189.

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    [8] QIU Tiaowen,ZHANG Yan,LI Jicheng,et al. Extraction and Enhancement of Information about LWIR polarization image [J]. Infrared,2014,35(5):13-23.

    [9] DU Anping,ZHAO Yongqiang,PAN Quan,et al. Image Enhancement algorithm based on polarization character [J]. Computer Measurement & Control,2007,15(1):106-108.

    [10] CHEN Weili,WANG Xia,JIN Weiqi,et al. Experiment of target detection based on medium infrared polarization imaging [J]. Infrared and Laser Engineering,2011,40(1):7-11.

    [11] LI Hailan,WANG Xia,ZHANG Chuntao,et al. The development and analysis of target detection research based on polarization imaging technology [J]. Optical Technique,2009,35(5):685-700.

    [12] LI Shuang,QIU Zhenwei,YANG Changjiu. Perliminary study on Technology of simultaneous imaging polarimetry [J]. Journal of Atmospheric and Environmental Optics,2010,5(3):198-201.

    ZENG Hengliang, ZHANG Mengwei, LIU Zheng, XIE Zongliang. Experiment of Target Detection Based on Polarization Imaging Using Polarization Parameter[J]. Opto-Electronic Engineering, 2016, 43(2): 22
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