• Infrared and Laser Engineering
  • Vol. 51, Issue 1, 20210987 (2022)
Haibo Luo1、2、3, Junchao Zhang4, Xingqin Gai5, and Yan Liu6
Author Affiliations
  • 1Key Laboratory of Opto-Electronic Information Processing, Chinese Academy of Sciences, Shenyang 110169, China
  • 2Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110169, China
  • 3Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang 110169, China
  • 4School of Aeronautics and Astronautics, Central South University, Changsha 410083, China
  • 5Hebei Hanguang Heavy Industry Co, Ltd, Handan 056107, China
  • 6Space Star Technology Co., LTD, Beijing 100086, China
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    DOI: 10.3788/IRLA20210987 Cite this Article
    Haibo Luo, Junchao Zhang, Xingqin Gai, Yan Liu. Development status and prospects of polarization imaging technology (Invited)[J]. Infrared and Laser Engineering, 2022, 51(1): 20210987 Copy Citation Text show less
    Infrared polarization imaging results of two scenes
    Fig. 1. Infrared polarization imaging results of two scenes
    Contrast curves of s0 and DoLP during 24 h for a scene
    Fig. 2. Contrast curves of s0 and DoLP during 24 h for a scene
    Experimental results of long-wave infrared polarization imaging for sky observation
    Fig. 3. Experimental results of long-wave infrared polarization imaging for sky observation
    Schematic diagram of division-of-focal-plane polarization sensor IMX250 MZR
    Fig. 4. Schematic diagram of division-of-focal-plane polarization sensor IMX250 MZR
    Diagram of MPA and its structural parameters
    Fig. 5. Diagram of MPA and its structural parameters
    Intensity diagram at different distances from MPA with plane wave incident (Unit: μm)
    Fig. 6. Intensity diagram at different distances from MPA with plane wave incident (Unit: μm)
    Variation curves of extinction ratio with longitudinal spacing under different alignment errors
    Fig. 7. Variation curves of extinction ratio with longitudinal spacing under different alignment errors
    Design featuresFabrication–integration issues, cost Misregistration issues
    Rotating element● Robust ● Relatively small ● Not suitable for dynamic scenes ● Easiest to implement ● Inexpensive ● Scene and platform motion ● Beam wander not a problem or removed in software ● Misregistration is linear
    Division of amplitude (multiple FPAs) ● Simultaneous acquisition ● Large system size ● High mechanical flexibility and rigidity required ● Expensive ● Large ● Must register multiple FPAs ● Misregistration can be fixed ● Can be nonlinear
    Division of aperture (single FPA) ● Simultaneous acquisition ● Smaller size ● Loss of spatial resolution ● Expensive ● Fixed misregistration ● Can be nonlinear
    Division of focal plane● Simultaneous acquisition ● Small and rugged ● Loss of spatial resolution ● Fabrication difficult ● Alignment difficult ● Very expensive ● IFOVs misregistered ● Requires interpolation ● Fixed registration
    Coboresighted● Simultaneous acquisition ● Best used at long ranges ● Easy integration ● Expensive ● Misregistration not as stable
    Table 1. Technical characteristics of typical polarization imaging methods[12]
    Haibo Luo, Junchao Zhang, Xingqin Gai, Yan Liu. Development status and prospects of polarization imaging technology (Invited)[J]. Infrared and Laser Engineering, 2022, 51(1): 20210987
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