Journals
Advanced Photonics
Photonics Insights
Advanced Photonics Nexus
Photonics Research
Advanced Imaging
View All Journals
Chinese Optics Letters
High Power Laser Science and Engineering
Articles
Optics
Physics
Geography
View All Subjects
Conferences
CIOP
HPLSE
AP
View All Events
News
About CLP
Search by keywords or author
Login
Registration
Login in
Registration
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
laser
wang mengyu
detector
Slow waves
VISAR
Yuan Shengfu
Journals >
Acta Optica Sinica >
Volume 42 >
Issue 7 >
Page 0712003 > Article
Acta Optica Sinica
Vol. 42, Issue 7, 0712003 (2022)
Three-Dimensional Measurement Method of Defects Based on Binocular Grating Reconstruction and Texture Mapping
Guanyu Hou
1
, Bin Wu
1、*
, Rongfang He
2、**
, and Weibin Zhang
2
Author Affiliations
1
National Key Laboratory of Precision Testing Techniques and Instrument, Tianjin University, Tianjin 300072, China
2
Institute of Chemical Materials, China Academy of Engineering Physics, Mianyang, Sichuan 621999, China
show less
DOI:
10.3788/AOS202242.0712003
Cite this Article
Set citation alerts
Guanyu Hou, Bin Wu, Rongfang He, Weibin Zhang. Three-Dimensional Measurement Method of Defects Based on Binocular Grating Reconstruction and Texture Mapping[J]. Acta Optica Sinica, 2022, 42(7): 0712003
Copy Citation Text
EndNote(RIS)
BibTex
Plain Text
show less
Cited By
Article index updated: Nov. 1, 2024
The article is cited by
8
article(s) CLP online library. (Some content might be in Chinese.)
Abstract
Get PDF(in Chinese)
Figures&Tables (13)
Equations (0)
References (29)
Cited By (8)
Get Citation
Copy Citation Text
Guanyu Hou, Bin Wu, Rongfang He, Weibin Zhang. Three-Dimensional Measurement Method of Defects Based on Binocular Grating Reconstruction and Texture Mapping[J]. Acta Optica Sinica, 2022, 42(7): 0712003
Download Citation
EndNote(RIS)
BibTex
Plain Text
Set citation alerts for the article
Tools
Share
Set citation alerts for the article
Save the article for my favorites
Paper Information
Category: Instrumentation, Measurement and Metrology
Received: Aug. 9, 2021
Accepted: Oct. 15, 2021
Published Online: Mar. 24, 2022
The Author Email: Wu Bin (wubin@tju.edu.cn), He Rongfang (herongfang@caep.cn)
DOI:
10.3788/AOS202242.0712003
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology
Set citation alerts for the article
Please enter your email address
Cancel
Confirm