• Chinese Journal of Quantum Electronics
  • Vol. 19, Issue 3, 217 (2002)
[in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Investigation of the Phase Diagram of YVO4 System[J]. Chinese Journal of Quantum Electronics, 2002, 19(3): 217 Copy Citation Text show less
    References

    [1] Levin E M. The system Y2O3-V2O5 [J]. J. Am. Ceram. Soc, 1967, 50:381

    [2] Lerner P, Legras C, Dumas J P. Stoechiometrie des monocristaux de metaniobate de lithium [J]. J. Crystal. Growth,1968, 3/4:231

    [3] Erdei S, Ainger F W. Growth of oxygen deficiency-free YVO4 single crystal by TSSG technique [J].J. Crystal.Growth, 1993, 128:1025-1030

    [4] Erdei S, Jin B M, Ainger F W et al. Possible trends for the growth of low scattering Nd:YVO4 laser crystal;phase relations-growth techniques [J]. J. Crystal. Growth, 1997, 172:466-472

    [5] Sangaletti L L, Allieri B et al. Search for impurity phases of Nd3+:YVO4 crystals for laser and luminescence applications [J]. J. Crystal. Growth, 1999, 198/199:454-459

    [6] Hoschek E, Klemm W. Investigation the system of V2O3-V2O5 [J]. Z. Anorg Allg. Chem., 1939, 63242

    [7] Andersson G. Preparation of YVO4 Oxides [J]. Acta. Chem. Scand, 1954, 8:1599

    [8] Kosuge K. The binary and ternary siagrams of YVO4 system [J]. J. Phys. Soc. Japan, 1967, 22:551

    [9] Ito Y, Tmarayama Y S. Flux grouth and characterizations of YVO4 crysals [J]. Solid. State. Ionics, 1987, 25:199

    [10] Koji Kosuge. The phase diagram and phase transition of the V2O3-V2O5 system [J]. J. Phys. Chem. Solids, 1967,28:1613

    [11] Anderson J S, Kahn A S. The stable and metal-stable phases in the V2O3-V2O5 system [J]. J. Less. Com. Met,1970, 22:214

    [12] Goutaudier C, Ermeneux F S et al. LPHG and flux growth of various Nd3+:YVO4 crystals: a comparative characterication [J]. Mater. Res. Bull, 1998, 33:1457-1465

    [in Chinese], [in Chinese], [in Chinese]. Investigation of the Phase Diagram of YVO4 System[J]. Chinese Journal of Quantum Electronics, 2002, 19(3): 217
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