• Opto-Electronic Engineering
  • Vol. 33, Issue 11, 61 (2006)
[in Chinese]1, [in Chinese]1, [in Chinese]1、2, [in Chinese]1, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Design of a multiple wavelength BRDF measurement device[J]. Opto-Electronic Engineering, 2006, 33(11): 61 Copy Citation Text show less
    References

    [2] Satoshi Tsuchida,Isao Sato,Shuhei Okada.Measurement of Land Syrface BRDF with Spatial Instability for Vicarious Calibration[J].SPIE,1999,3870:254-258.

    [3] Stephen R.Marschner,Stephen H.Westin,Eric P.F.Lafortune,et al.Image-based BRDF Measurement Including Human Skin[A].In 10th Eurographics Workshop on Rendering[C].Granada,Spain,1999.131-144.

    [4] Jeffrey R.Johnson,William M.Grundy,Michael K.Shepard.Visible/near-infrared spectrogoniometric observations and modeling of dust-coated rocks[J].Icarus,2004,171:546-556.

    [5] K.J.Dana.BRDF/BTF Measurement Device[J].IEEE,2001,2:460-466.

    [6] F.E.Nicodemus.Reflectance,Nomenclature,and Directional Reflectance and Emissivity[J].Appl.Opt,1970,9:1474-1475.

    [7] Dr.B.M.Kale.In Situ Bidirectional Reflectance Distribution Function (BRDF) Measurement Facility[J].SPIE,1979,171:177-180.

    [8] Di Girolamo L.Generalizing the definition of the bi-directional reflectance[J].Remote Sensing of Environment,2003,88:479-482.

    [9] Tod F.Schiff,Mary W.Knighton,Daniel J.Wilson.Design Review ora High Accuracy UV to Near IR Scatterometer[J].SPIE,1993,1995:121-128.

    CLP Journals

    [1] Wang Anjing, Fang Yonghua, Li Dacheng, Cui Fangxiao. Physical-based fine simulation of pollutant gas cloud′s infrared spectrum[J]. Infrared and Laser Engineering, 2017, 46(1): 104002

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Design of a multiple wavelength BRDF measurement device[J]. Opto-Electronic Engineering, 2006, 33(11): 61
    Download Citation