[1] Pendry J B. Negative Refraction Makes a Perfect Lens [J]. Physical Review Letters(S0031-9007), 2000, 85(18): 3966-3969.
[2] FANG Nicholas, ZHANG Xiang. Imaging properties of a metameterial superlens [J]. Applied Physics Letters(S0003-6951), 2003, 82(2): 161-163.
[4] Wood B, Pendry J B, Tsai D P. Directed subwavelength imaging using a layered metal-dielectric system [J]. Physical Review B(S1098-0121), 2006, 74: 115116-115124.
[5] WANG Changtao, ZHAO Yanhui, GAN Dachun, et al. Subwavelength imaging with anisotropic structure comprising alternately layered metal and dieletric films [J]. Optics Express(S1094-4087), 2008, 16(6): 4217-4227.
[6] NamS H, Avila E U, Bartal G, et al. Deep subwavelength surface modes in metal–dielectric metamaterials [J]. Optics Letters(S0146-9592), 2010, 35(11): 1847-1849.
[7] Schurig D, Smith D R. Spatial.ltering using media with indefinite permittivity and permeability tensors [J]. Applied Physics Letters(S0003-6951), 2003, 82(14): 2215-2217.
[8] XIONG Yi, LIU Zhaowei, ZHANG Xiang. Projecting deep-subwavelength patterns from diffraction-limited masks using metal-dielectric multilayers [J]. Applied Physics Letters(S0003-6951), 2008, 93: 111116-111119.
[9] XU Ting, ZHAO Yanhui, MA Junxian, et al. Sub-diffraction-limited interference photolithography with metamaterials [J]. Optics Express(S1094-4087), 2009, 16(18): 13579-13584.
[10] WANG Changtao, GAO Ping, TAO Xing, et al. Far field observation and theoretical analyses of light directional imaging in metamateial with stacked metal-dielectric films [J]. Applied Physics Letters(S0003-6951), 2013, 103: 031911-031914.
[11] REN Guowei, LAI Zhian, WANG Changtao, et al. Subwavelength focusing of light in the planar anisotropic metamaterials with zone plates [J]. Optics Express(S1094-4087), 2011, 18(17): 18151-18157.
[12] Palik E D. Handbook of Opticsl Constants [M]. San Diego: Academic Press, 1998.
