NEW TECHNOLOGY TO ACQUIRE HIGH RESOLUTION IMAGE UNDER LARGE DEFOUCS

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Journal of Infrared and Millimeter Waves >Volume 23 >Issue 6 >Page 473 > Article

Journal of Infrared and Millimeter Waves
Vol. 23, Issue 6, 473 (2004)

NEW TECHNOLOGY TO ACQUIRE HIGH RESOLUTION IMAGE UNDER LARGE DEFOUCS

[in Chinese]¹, [in Chinese]¹, and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese]. NEW TECHNOLOGY TO ACQUIRE HIGH RESOLUTION IMAGE UNDER LARGE DEFOUCS[J]. Journal of Infrared and Millimeter Waves, 2004, 23(6): 473 Copy Citation Text

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References

[1] Tucker Sara C, Dowski Edward R, Cathey W Thomas. Extended depth of field and aberration control for inexpensive digital microscope systems[J]. Optics Express, 1999, 4(8): 467-474.

[2] Dowski E R, Cathey W T. Extended depth of field through wave-front coding[J]. Appl.Opt. 1995, 34(10): 1859-1866.

[3] Brenner K, Lohman A, Ojeda-Casteneda J. The ambiguity function as a polar display of the OTF[J]. Opt.Commun,1983, 44(5): 323-326.

[5] Key E L, Fowle E N, Haggarty R D. A method of designing signals of large time-bandwidth product[J]. Ire Internal Convention Record, 1961: 146-155.

[in Chinese], [in Chinese], [in Chinese]. NEW TECHNOLOGY TO ACQUIRE HIGH RESOLUTION IMAGE UNDER LARGE DEFOUCS[J]. Journal of Infrared and Millimeter Waves, 2004, 23(6): 473

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