• Acta Photonica Sinica
  • Vol. 50, Issue 5, 86 (2021)
Yishuai HAN1、2, Tianyu SUN2, Huimin JIA1, Jilong TANG1, Dan FANG1, Dengkui WANG1, Xiaohua WANG1, Baoshun ZHANG2, and Zhipeng WEI1
Author Affiliations
  • 1State Key Laboratory of High Power Semiconductor Laser, College of Science, Changchun University of Science and Technology, Changchun30022, China
  • 2Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, Jiangsu1513, China
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    DOI: 10.3788/gzxb20215005.0514003 Cite this Article
    Yishuai HAN, Tianyu SUN, Huimin JIA, Jilong TANG, Dan FANG, Dengkui WANG, Xiaohua WANG, Baoshun ZHANG, Zhipeng WEI. Critical Coupling Condition and Preparation Technology of Aluminum Nitride Microring Resonator[J]. Acta Photonica Sinica, 2021, 50(5): 86 Copy Citation Text show less
    Microring characteristics map
    Fig. 1. Microring characteristics map
    Relationship between coupling strength and phase mismatch
    Fig. 2. Relationship between coupling strength and phase mismatch
    Bend-coupled microring resonator
    Fig. 3. Bend-coupled microring resonator
    XRD test chart of AlN single crystal film
    Fig. 4. XRD test chart of AlN single crystal film
    Flow chart of preparation of microring structure
    Fig. 5. Flow chart of preparation of microring structure
    Pattern distortion caused by electron beam lithography of insulating substrate material
    Fig. 6. Pattern distortion caused by electron beam lithography of insulating substrate material
    The effect of electron beam lithography in the coupling area of two conductive layers
    Fig. 7. The effect of electron beam lithography in the coupling area of two conductive layers
    SEM image of four groups of etching results with different parameters
    Fig. 8. SEM image of four groups of etching results with different parameters
    SEM image of bending coupling microring
    Fig. 9. SEM image of bending coupling microring
    GroupVacuumPBPRFFux(Cl2)Flux(BCl3)Time
    # 15 mT200 W650 W60 sccm30 sccm70 s
    # 25 mT200 W500 W60 sccm30 sccm60 s
    # 35 mT200 W500 W60 sccm10 sccm60 s
    # 45 mT200 W500 W60 sccm10 sccm50 s
    Table 1. Etching parameters of AlN
    Yishuai HAN, Tianyu SUN, Huimin JIA, Jilong TANG, Dan FANG, Dengkui WANG, Xiaohua WANG, Baoshun ZHANG, Zhipeng WEI. Critical Coupling Condition and Preparation Technology of Aluminum Nitride Microring Resonator[J]. Acta Photonica Sinica, 2021, 50(5): 86
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