• Spectroscopy and Spectral Analysis
  • Vol. 42, Issue 3, 859 (2022)
Wei-na DUAN1、*, Xia JING1、1; *;, Liang-yun LIU2、2;, Teng ZHANG1、1;, and Li-hua ZHANG3、3;
Author Affiliations
  • 11. College of Geomatics, Xi’an University of Science and Technology, Xi’an 710054, China
  • 22. Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100094, China
  • 33. College of Arts and Sciences, Shanghai Maritime University, Shanghai 201306, China
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    DOI: 10.3964/j.issn.1000-0593(2022)03-0859-07 Cite this Article
    Wei-na DUAN, Xia JING, Liang-yun LIU, Teng ZHANG, Li-hua ZHANG. Monitoring of Wheat Stripe Rust Based on Integration of SIF and Reflectance Spectrum[J]. Spectroscopy and Spectral Analysis, 2022, 42(3): 859 Copy Citation Text show less
    Correlation between SIFP and DI in the canopy Note: extremely significant level of 0.1%, R0.001[50]=0.451, same as below
    Fig. 1. Correlation between SIFP and DI in the canopy Note: extremely significant level of 0.1%, R0.001[50]=0.451, same as below
    Correlation between SIFP-NDVI and DI in canopy
    Fig. 2. Correlation between SIFP-NDVI and DI in canopy
    Correlation between SIFP-MTCI and DI in canopy
    Fig. 3. Correlation between SIFP-MTCI and DI in canopy
    Correlation between SIFP-NDVI*MTCI and DI in canopy
    Fig. 4. Correlation between SIFP-NDVI*MTCI and DI in canopy
    Monitoring model of wheat stripe rust with SIFP as independent variable
    Fig. 5. Monitoring model of wheat stripe rust with SIFP as independent variable
    Monitoring model of wheat stripe rust with SIFP-NDVI as independent variable
    Fig. 6. Monitoring model of wheat stripe rust with SIFP-NDVI as independent variable
    Monitoring model of wheat stripe rust with SIFP-MTCI as independent variable
    Fig. 7. Monitoring model of wheat stripe rust with SIFP-MTCI as independent variable
    Monitoring model of wheat stripe rust with SIFP-NDVI*MTCI as independent variable
    Fig. 8. Monitoring model of wheat stripe rust with SIFP-NDVI*MTCI as independent variable
    组别数据处理SIFPSIFP-NDVISIFP-MTCISIFP-NDVI*MTCI
    Ⅰ组RMSE0.1140.1090.0750.053
    R20.8660.8770.9410.971
    Ⅱ组RMSE0.1200.1180.1150.108
    R20.8530.8590.8660.882
    Ⅲ组RMSE0.1140.1070.0960.093
    R20.8460.8670.8920.899
    Table 1. Model accuracy test
    Wei-na DUAN, Xia JING, Liang-yun LIU, Teng ZHANG, Li-hua ZHANG. Monitoring of Wheat Stripe Rust Based on Integration of SIF and Reflectance Spectrum[J]. Spectroscopy and Spectral Analysis, 2022, 42(3): 859
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