[1] Yang li. Advanced Optical Manufacturing Technology[M].Beijing: Science press,2001

[2] Pan Junhua. Optical problems in imaging optical engineering[J]. Engineering Science, 2000,2(3):32～35

[3] Pan Junhua. The Design. Manufacture and Test of The Aspherical Optical Surfaces[M]. Beijing: Science press,1994

[4] Liu Yuankun, Su Xianyu, Wu Qingyang. Three-dimensional shape measurement for specular surface based on fringe reflection[J]. Acta Optical Sinica,2006,26(11):1636～1640

[5] Liu Yuankun, Su Xianyu, Wu Qingyang.Wavefront Measurement for Transparent Object by Active Deflectometry[J]. Chin. J. Lasers, 2007,34(4):512～518

[6] Thorsten Bothe, Wansong Li, Christoph von Kopylow et al.. High-resolution 3D shape measurement on specular surfaces by fringe reflection[C]. SPIE, 2004, 5457:411～422

[7] Wansong Li, Thorsten Bothe, Christoph von Kopylow et al.. Evaluation methods for gradient measurements techniques[C]. SPIE,2004, 5457: 300～311

[8] Markus C.Knauer, Jurgen Kaminski et al.. Phase measuring Deflectometry: a new approach to measure specular free-form surfaces[C]. SPIE, 2004,5457:366～376

[9] Marcus Petz, Rainer Tutsch, Reflection grating photogrammetry: a technique for absolute shape measurement of specular free-form surfaces[C]. SPIE, 2005, 5869:355～366

[10] Li Wansong, Su Likun, Su Xianyu.Phase-Measuring Profilometry in Big Scale Measurement[J]. Acta Optica Sinica, 2000,20(6):792～796