• Optics and Precision Engineering
  • Vol. 14, Issue 5, 754 (2006)
XIONG Xian-cai1, ZHONG Xian-xin2, XIAO Sha-li2, and ZHU Gang2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    XIONG Xian-cai, ZHONG Xian-xin, XIAO Sha-li, ZHU Gang. Elliptically bent crystal spectrometer for measuring laser-produced plasma X-ray[J]. Optics and Precision Engineering, 2006, 14(5): 754 Copy Citation Text show less
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    CLP Journals

    [1] WANG Hong-jian, XIAO Sha-li, SHI Jun. Diagnosis of X-ray polarized spectrum of laser-produced plasma by modified double-crystal method[J]. Optics and Precision Engineering, 2011, 19(12): 2821

    XIONG Xian-cai, ZHONG Xian-xin, XIAO Sha-li, ZHU Gang. Elliptically bent crystal spectrometer for measuring laser-produced plasma X-ray[J]. Optics and Precision Engineering, 2006, 14(5): 754
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