• Optics and Precision Engineering
  • Vol. 14, Issue 5, 754 (2006)
XIONG Xian-cai1, ZHONG Xian-xin2, XIAO Sha-li2, and ZHU Gang2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    XIONG Xian-cai, ZHONG Xian-xin, XIAO Sha-li, ZHU Gang. Elliptically bent crystal spectrometer for measuring laser-produced plasma X-ray[J]. Optics and Precision Engineering, 2006, 14(5): 754 Copy Citation Text show less

    Abstract

    An elliptically bent crystal spectrometer has been designed and fabricated with an X-ray Charge Coupled Device(CCD) as the detector and a piece of PET(2d=0.874 nm) crystal elliptically bent and fixed on a stainless steel substrate with an eccentricity of 0.9586 and a focal length of 1350 mm is used as the dispersive and focusing element to measure 0.44~0.81 nm X-ray spectra emitted from laser-produced plasmas.The experimental results obtained through application experiments performed at the XG-2 target chamber demonstrate that the spectral resolution of this spectrometer approximates 1000.
    XIONG Xian-cai, ZHONG Xian-xin, XIAO Sha-li, ZHU Gang. Elliptically bent crystal spectrometer for measuring laser-produced plasma X-ray[J]. Optics and Precision Engineering, 2006, 14(5): 754
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