• Opto-Electronic Engineering
  • Vol. 32, Issue 4, 16 (2005)
[in Chinese]1、2, [in Chinese]1, and [in Chinese]1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(4): 16 Copy Citation Text show less
    References

    [1] Mark R.KOZLOWSKI,Robert CHOW.The role of defects in laser damage of multilayer coatings [J].SPIE,1994,2114:640-649.

    [2] Michael R.LANGE,John K.MCIVER,Arthur H.GUENTHER.The influence of the thermal and mechanical properties of optical materials in thin film from on their damage resistance to pulsed lasers [J].Thin Solid Films,1984,118(1):49-60.

    [3] Michael R.LANGE,John K.MCIVER,Arthur H.GUENTHER.Pulsed laser damage in thin film coatings:fluorides and oxides [J].Thin Solid Films,1985,125(1):143-155.

    [4] PALMER J.R.Continuous wave laser damage on optical components [J].Opt.Eng,1983,22(4):435-446.

    [5] Florian BONNEAU,Patrick COMBIS,Jacques VIERNE,et al.Simulation of laser damage of SiO2 induced by a spherical inclusion [J].SPIE,2001,4347:308-314.

    [6] Robert J.TENCH,Robert CHOW,Mark R.KOZLOWSKI.Characterization of defect geometries in multilayer optical coating [J].SPIE,1994,2114:415-425.

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    [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(4): 16
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