Phase-measuring profilometry is one of the most effective methods of obtaining the three-dimensional topography information of the object surface. However, in terms of objects with large changes in surface reflectivity, it is difficult for traditional fringe projection technology to achieve high-precision topography measurement in both high reflectivity and low reflectivity regions. To solve this problem, we propose a recursive adaptive fringe projection method. This method can analyze the pixels with saturated and insufficient brightness in the collected image and adjust the brightness of the projected pattern adaptively according to the coordinate mapping relationship. Then, the projection brightness of all the pixels would be recursively driven to approach the best projection brightness so as to avoid saturation and improve the signal-to-noise ratio. The experimental results show that the proposed method can accurately adjust the projection brightness. Only a small amount of recursion is required to correct 99.3% of pixels with unreasonable projection brightness. In addition to improving the three-dimensional display effect of the high dynamic range surface, this method has also enhanced the measurement accuracy of the three-dimensional topography.