Determination of the Extinction Coefficient of TiO2 and Effect of Preparation Parameters

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 25 >Issue 7 >Page 1005 > Article

Acta Optica Sinica
Vol. 25, Issue 7, 1005 (2005)

Determination of the Extinction Coefficient of TiO₂ and Effect of Preparation Parameters

[in Chinese]^*, [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Determination of the Extinction Coefficient of TiO₂ and Effect of Preparation Parameters[J]. Acta Optica Sinica, 2005, 25(7): 1005 Copy Citation Text

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References

[1] Zoller R. Gtzelmann, K. Matl, D. Cushing. Temperature-stable bandpass filters deposited with plasma ion-assisted deposition [J]. Appl. Opt., 1996, 35(28): 5609～5612

[4] Jean M. Bennett, Emile Pelletier, G. Albrand et al.. Comparison of the properties of titanium dioxide films prepared by various techniques[J]. Appl. Opt., 1989, 28(15): 3303～3317

[5] Ebert J. Activated reactive evaporation[C]. Proc. SPIE, 1982, 325: 29～38

[6] Shu-chung Chiao, B. G. Bovard, H. A. Macleod. Repeatability of the composition of titanium oxide films produced by evaporation of Ti2O3[J]. Appl. Opt., 1998, 37(22): 5284～5290

[8] W. B. Jackson, N. M. Amer, A. C. Boccara et al.. Photothermal deflection spectroscopy and detection[J]. Appl. Opt., 1981, 20(8): 1333～1344

[9] R. M. A. Azzam. Ellipsometry in Handbook of Optics[M]. Vol.2, ed. Bass M, Chapt.27, McGraw-Hill, New York, 1995