• Acta Optica Sinica
  • Vol. 20, Issue 5, 642 (2000)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Determination of the Complex Dielectric Coefficient and Thickness of Absorbing Films Using Guided Waves[J]. Acta Optica Sinica, 2000, 20(5): 642 Copy Citation Text show less
    References

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    [2] Ghatak A K,Thyagarajank K,Shenoy M R.Numerical analysis of planar optical waveguides using matrix approach.J.Lightwave Technol.,1987,5(5):660~667

    [3] Thyagarajank K,Diggavi S,Ghatak A K.Analytical investigations of leaky and absorbing planar waveguides.Opt.Quantum Electron.,1987,19(2):131~137

    [4] Lin Y Z,Zhan J H,Tseng S M.A new method of analyzing the light transmission in leaky and absorbing planar waveguides.IEEE Photonics Technol.Lett.,1997,9(9):1241~1243

    [5] Yang F,Sambles J R.Determination of the optical permittivity and thickness of absorbing films using long range modes.J.Mod.Opt.,1997,44(6):1155~1163

    [6] Sarid D.Long-range surface-plasma waves on very thin metal films.Phys.Rev.Lett.,1981,47(26):1927~1930

    [7] Yang F,Sambles J R,Bradberry G W.Long-range surface modes supported by thin films. Phys. Rev. (B), 1991, 44(11):5855~5872

    [8] Cao Z,Hu C,Jin G.Method of equivalent refractive indices in multi-quantum-well waveguides with arbitrary shaped base periods.J.Opt.Soc.Am.(B),1991,8(12):2519~2522

    [9] Ramadas M R,Garmire E,Ghatak A K et al..Analysis of absorbing and leaky planar waveguides: A novel method.Opt.Lett.,1989,14(7):376~378

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    [2] Xue Hui, Shen Weidong, Gu Peifu, Luo Zhenyue, Liu Xu, Zhang Yueguang. Thickness Measurement of Thin Film Based on White-Light Spectral Interferometry[J]. Acta Optica Sinica, 2009, 29(7): 1877

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Determination of the Complex Dielectric Coefficient and Thickness of Absorbing Films Using Guided Waves[J]. Acta Optica Sinica, 2000, 20(5): 642
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