• Opto-Electronic Engineering
  • Vol. 32, Issue 1, 63 (2005)
[in Chinese]1、2, [in Chinese]1、2, [in Chinese]1、2, and [in Chinese]1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(1): 63 Copy Citation Text show less
    References

    [2] CARRON T,LAMBERT P. Color edge detector using jointly hue,saturation and intensity [J]. Image Processing, 1994. Proceedings. ICIP-94., IEEE International Conference,1994,3:977-981.

    [4] SCHARCANSKI J,VENETSANOPOULOS A. N. Edge detection of color images using directional operators [J]. IEEE Transactions on Circuits and Systems for Video Technology,1997,7(2):397-401.

    [6] TRAHANIAS P. E,VENETSANOPOULOS A. N. Color edge detection using vector order statistics[J]. IEEE Transactions on Image Processing,1993,2(2):259-264.

    [7] TRAHANIAS P. E,VENETSANOPOULOS A. N. Vector order statistics operators as color edge detectors [J]. IEEE Transactions on Systems, Man and Cybernetics, Part B,1996,26(1):135-143.

    [8] PLATANIOTIS K. N,VENETSANOPOULOS A. N. Color image processing and applications [M]. Berlin:Springer,2000. 179-207.

    [10] MALLAT S,ZHONG S. Characterization of signals from multiscale edges [J]. IEEE Transactions on Pattern Analysis and Machine Intelligence,1992,14(7):710-732.

    [11] TANG Y. Y,YANG L,LIU J. Characterization of Dirac-Structure edge with wavelet transform [J]. IEEE Transactions on Systems, Man, and Cybernetics, Part B: Cybernetics,2000,30(1):93-109.

    CLP Journals

    [1] Wang Shuang, Wang Zhibin, Zhang Minjuan, Li Xiao. High Sensitive Measurement of Crystal Electro-Optic Coefficients Based on Photo-Elastic Modulation[J]. Acta Optica Sinica, 2017, 37(3): 326001

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(1): 63
    Download Citation