• Laser & Optoelectronics Progress
  • Vol. 50, Issue 2, 21701 (2013)
Yu Haimin1、*, Niu Yuan1, Liu Guilin1, Meng Zhuo2、3, Yao Steve1、2、4, and Li Guohua1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4General Photonics Corporation, 5228 Edison Avenue, Chino, California 91710, USA
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    DOI: 10.3788/lop50.021701 Cite this Article Set citation alerts
    Yu Haimin, Niu Yuan, Liu Guilin, Meng Zhuo, Yao Steve, Li Guohua. Sweep Light Source OCT Method for the Test of Textured Monocrystalline Silicon[J]. Laser & Optoelectronics Progress, 2013, 50(2): 21701 Copy Citation Text show less
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    Yu Haimin, Niu Yuan, Liu Guilin, Meng Zhuo, Yao Steve, Li Guohua. Sweep Light Source OCT Method for the Test of Textured Monocrystalline Silicon[J]. Laser & Optoelectronics Progress, 2013, 50(2): 21701
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