• Microelectronics
  • Vol. 51, Issue 2, 246 (2021)
CHEN Weizhen and CHENG Junji
Author Affiliations
  • [in Chinese]
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    DOI: 10.13911/j.cnki.1004-3365.200310 Cite this Article
    CHEN Weizhen, CHENG Junji. An IGBT with Partial High Permittivity Dielectric Modulation[J]. Microelectronics, 2021, 51(2): 246 Copy Citation Text show less
    References

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    [2] ANTONIOU M, UDREA F, BAUER F. The superjunction insulated gate bipolar transistor optimization and modeling [J]. IEEE Trans Elec Dev, 2010, 57(3): 594-600.

    [3] CHEN W Z, CHENG J J, CHEN X B. A novel IGBT with high-k dielectric modulation achieving ultralow turn-off loss [J]. IEEE Trans Elec Dev, 2020, 67(3): 1066-1070.

    [4] OH K H, KIM J, SEO H. Experimental investigation of 650 V superjunction IGBTs [C] ∥ Proceed ISPSD. Prague, Czech Republic. 2016: 299-302.

    [5] IWAMOTO S, TAKAHASHI K, LURIBAYASHI H, et al. Above 500 V class superjunction MOSFETs fabricated by deep trench etching and epitaxial growth [C] ∥ Proceed ISPSD. Santa Barbara, CA, USA. 2005: 31-34.

    [6] WANG H, NAPOLI E, UDREA F. Breakdown voltage for superjunction power devices with charge imbalance: an analytical model valid for both punch through and non punch through devices [J]. IEEE Trans Elec Dev, 2009, 56(12): 3175-3183.

    [7] CHENG J J, CHEN W Z, LIN J J. Potential of utilizing high-k film to improve the cost performance of trench LDMOS [J]. IEEE Trans Elec Dev, 2019, 66(7): 3049-3054.

    [8] LIN J J, CHENG J J, LI P. Study on SrTiO3 film for the application of power devices [J]. Superlattices and Microstructures, 2019, 130: 168-174.

    [9] CHEN X B, HUANG M M. A vertical power MOSFET with an interdigitated drift region using high-k insulator [J]. IEEE Trans Elec Dev, 2012, 59(9): 2430-2437.

    CHEN Weizhen, CHENG Junji. An IGBT with Partial High Permittivity Dielectric Modulation[J]. Microelectronics, 2021, 51(2): 246
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