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    Journals >Opto-Electronic Engineering >Volume 39 >Issue 7 >Page 61 > Article
    • Opto-Electronic Engineering
    • Vol. 39, Issue 7, 61 (2012)
    The Measurement of Parallelism Based on Diffraction Grating
    FU Hong1、2、*, WU Qiong1、2, LIN Bin1、2, and CAO Xiang-qun1、2
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  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2012.07.010 Cite this Article
    FU Hong, WU Qiong, LIN Bin, CAO Xiang-qun. The Measurement of Parallelism Based on Diffraction Grating[J]. Opto-Electronic Engineering, 2012, 39(7): 61 Copy Citation Text show less
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    FU Hong, WU Qiong, LIN Bin, CAO Xiang-qun. The Measurement of Parallelism Based on Diffraction Grating[J]. Opto-Electronic Engineering, 2012, 39(7): 61
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