• Laser & Optoelectronics Progress
  • Vol. 57, Issue 3, 031201 (2020)
Shuo Jiang, Linghui Yang, Yongjie Ren, and Jigui Zhu*
Author Affiliations
  • State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
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    DOI: 10.3788/LOP57.031201 Cite this Article Set citation alerts
    Shuo Jiang, Linghui Yang, Yongjie Ren, Jigui Zhu. Defect Detection in Mirror-Like Object Surface Based on Phase Deflection[J]. Laser & Optoelectronics Progress, 2020, 57(3): 031201 Copy Citation Text show less
    Schematic of mirror surface defect detection based on PMD
    Fig. 1. Schematic of mirror surface defect detection based on PMD
    Mirror surface defect detection system based on PMD
    Fig. 2. Mirror surface defect detection system based on PMD
    Extraction of wrapped phase Φ(x,y). (a) Sequence image of four-step phase-shift; (b) wrapped phase Φ(x,y)
    Fig. 3. Extraction of wrapped phase Φ(x,y). (a) Sequence image of four-step phase-shift; (b) wrapped phase Φ(x,y)
    Wrapped phase jump error. (a) Wrapped phase Φ(x,y) and corresponding a of jump error in some row; (b) local amplification of wrapped phase jump error
    Fig. 4. Wrapped phase jump error. (a) Wrapped phase Φ(x,y) and corresponding a of jump error in some row; (b) local amplification of wrapped phase jump error
    Correction of wrapped phase jump error. (a) Wrapped phase with and without correction; (b) local amplification of wrapped phase correction effect
    Fig. 5. Correction of wrapped phase jump error. (a) Wrapped phase with and without correction; (b) local amplification of wrapped phase correction effect
    Calculation of period index k(x,y). (a) Sequence image of Gray-code; (b) period index k(x,y)
    Fig. 6. Calculation of period index k(x,y). (a) Sequence image of Gray-code; (b) period index k(x,y)
    Unfolding of wrapped phase. (a) Wrapped phase Φ(x,y); (b) period index k(x,y) of wrapped phase; (c) absolute phase ?(x,y)
    Fig. 7. Unfolding of wrapped phase. (a) Wrapped phase Φ(x,y); (b) period index k(x,y) of wrapped phase; (c) absolute phase ?(x,y)
    Error in phase unwrapping. (a) Diagram of absolute phase intensity; (b) absolute phase of marked line in Fig. 8(a)
    Fig. 8. Error in phase unwrapping. (a) Diagram of absolute phase intensity; (b) absolute phase of marked line in Fig. 8(a)
    Correction of period index k(x,y)
    Fig. 9. Correction of period index k(x,y)
    Painted fuselage sample
    Fig. 10. Painted fuselage sample
    Diagram of experimental system
    Fig. 11. Diagram of experimental system
    Defect detection results without and with period index correction. (a)(b) Intensity images of absolute phase; absolute phases of marked line in (c) Fig. 12(a) and (d) Fig. 12(b); defect detection results in (e) Fig. 12(a) and (f) Fig. 12 (b)
    Fig. 12. Defect detection results without and with period index correction. (a)(b) Intensity images of absolute phase; absolute phases of marked line in (c) Fig. 12(a) and (d) Fig. 12(b); defect detection results in (e) Fig. 12(a) and (f) Fig. 12 (b)
    Defect locations and contours. (a) Defect locations and contours on wrapped phase image; (b) local amplification of defects
    Fig. 13. Defect locations and contours. (a) Defect locations and contours on wrapped phase image; (b) local amplification of defects
    Defect locations and contours on painted surface. (a) Hairy fiber; (b) sagging; (c) paint slag;(d) scratch before paint; (e) dirt; (f) dent; (g) craters; (h) bump
    Fig. 14. Defect locations and contours on painted surface. (a) Hairy fiber; (b) sagging; (c) paint slag;(d) scratch before paint; (e) dirt; (f) dent; (g) craters; (h) bump
    Shuo Jiang, Linghui Yang, Yongjie Ren, Jigui Zhu. Defect Detection in Mirror-Like Object Surface Based on Phase Deflection[J]. Laser & Optoelectronics Progress, 2020, 57(3): 031201
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