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Journals >Opto-Electronic Engineering >Volume 32 >Issue 4 >Page 52 > Article

Opto-Electronic Engineering
Vol. 32, Issue 4, 52 (2005)

[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(4): 52 Copy Citation Text

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References

[3] Hideaki YAMAGISHI,Yasuyuki SUZUKI,Akio HIRAIDE.Precise measurement of photodiode spectral responses using the calorimetric method [J].IEEE Transactions on Instrumentation and Measurement,1989,38(2):578-580.

[4] M.KOBAYASHI,T.SHIRAI,T.KANEDA.High reliability planar InGaAs avalanche photodiodes[A].Electron Device Meeting[C].Washington DC:IEEE,1989.729-732.

[5] M.Ye.BELKIN,M.V.EYNASTO.Measurement of photodiode frequency characteristics by means of a physical equivalent circuit [J].Telecommunications and Radio Engineering, Part2(Radio Engineering),1989,44(12):91-94.

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[1] Xu Xinhua, Wang Qing, Qian Zheng, Zhang Shexian. Automatic Measurement System of Invar Rods Based on Image Processing[J]. Acta Optica Sinica, 2009, 29(6): 1519

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(4): 52

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