The dual four-channel simultaneous interference imaging spectrometer, using a field view stop instead of the slit filter, without rotating and moving parts, divides the incident light into four coherent beams through achromatic beam splitters and Savart polariscopes. Four interference fringes with different polarization informations are obtained in the detectors. Spectral images can be acquired with the Fourier transform algorithm and image processing. Expressions for interference intensities are presented. The total intensity of the target image is obtained by summation of the four interferograms. The difference between interference intensities in the same CCD is equivalent to the pure interference fringes. The difference or summation of two pure interference fringes of different CCDs is equivalent to the single-channel interference fringes, which improves the signal-noise ration of the system. The optical path differences varying with wavelength, incidence angle, incident azimuth angle and Savart polariscope thickness are described based on the analysis of dispersing result from crystal. Considering the paraxial approximation, the fringe distribution is analyzed, and then the lateral displacement and the focal length of the lens are designed. The thickness of the crystal is discussed. This spectrometer is characterized by the simultaneous acquisition of four target images with different polarization informations. The background intensity is suppressed, and the spatial filtering and the jitter noise caused by moving or rotating parts are avoided. The results show that high resolution imaging is realized. This study provides a new solution for the design and application of interference imaging spectroscopy.