• Laser & Optoelectronics Progress
  • Vol. 57, Issue 6, 061101 (2020)
Chenghua Fan1、2、3、*, Qunjing Wang1、2, Xinyuan Cao3, Bingbing Chen3, and Qi Qi3
Author Affiliations
  • 1School of Electrical Engineering and Automation, Anhui University, Hefei, Anhui 230601, China
  • 2Engineering Research Center of Power Quality, Ministry of Education, Anhui University, Hefei, Anhui 230601, China
  • 3Anhui Provincial Key Laboratory of Simulation and Design for Electronic Information System, Hefei Normal University, Hefei, Anhui 230601, China
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    DOI: 10.3788/LOP57.061101 Cite this Article Set citation alerts
    Chenghua Fan, Qunjing Wang, Xinyuan Cao, Bingbing Chen, Qi Qi. Defect Detection Method for Solar Cell Based on Signal Catastrophe-Points Correction[J]. Laser & Optoelectronics Progress, 2020, 57(6): 061101 Copy Citation Text show less
    Principle of detecting the signal catastrophe-points with wavelet transform
    Fig. 1. Principle of detecting the signal catastrophe-points with wavelet transform
    Defect images of solar cells. (a) Scratch; (b) scratch and spot; (c) abrasion
    Fig. 2. Defect images of solar cells. (a) Scratch; (b) scratch and spot; (c) abrasion
    Flow chart of algorithm
    Fig. 3. Flow chart of algorithm
    Capture of the signal catastrophe-points
    Fig. 4. Capture of the signal catastrophe-points
    Correction of the signal catastrophe-points
    Fig. 5. Correction of the signal catastrophe-points
    Calibration process of column signal from defect images. (a) Scratch in the 200th column; (b) scratch and spot in the 222nd column;(c) abrasion in the 80th column
    Fig. 6. Calibration process of column signal from defect images. (a) Scratch in the 200th column; (b) scratch and spot in the 222nd column;(c) abrasion in the 80th column
    Background corresponding to the defect images. (a) Scratch; (b) scratch and spot; (c) abrasion
    Fig. 7. Background corresponding to the defect images. (a) Scratch; (b) scratch and spot; (c) abrasion
    Defect images and processing results. (a) Scratch; (b) scratch and spot; (c) abrasion
    Fig. 8. Defect images and processing results. (a) Scratch; (b) scratch and spot; (c) abrasion
    Chenghua Fan, Qunjing Wang, Xinyuan Cao, Bingbing Chen, Qi Qi. Defect Detection Method for Solar Cell Based on Signal Catastrophe-Points Correction[J]. Laser & Optoelectronics Progress, 2020, 57(6): 061101
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