• Laser & Optoelectronics Progress
  • Vol. 50, Issue 11, 110401 (2013)
Kong Fanlin1、2、*, Zhou Yue1, Chen Xue1, Sui Yongxin1, Yang Huaijiang1, and Wen Gang1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop50.110401 Cite this Article Set citation alerts
    Kong Fanlin, Zhou Yue, Chen Xue, Sui Yongxin, Yang Huaijiang, Wen Gang. Measurement of Fatigue Properties of Solar-Blind Ultraviolet Intensified CCD[J]. Laser & Optoelectronics Progress, 2013, 50(11): 110401 Copy Citation Text show less

    Abstract

    To evaluate the evolution of response of solar blind ultraviolet (SBUV) intensified CCD (ICCD) versus working time, a novel fatigue property testing scheme is proposed and actual experiments are carried out for two typical work patterns. At first, two typical working modes for SBUV-ICCD are introduced based on the fundamental construction and principle. Secondly, the device fatigue property is defined and a novel fatigue testing scheme is designed. Finally, fatigue testing for two SBUV-ICCDs is done and their uncertainties are analyzed. The testing results show that the fatigue properties of a homemade SBUV-ICCD in photoelectric simulation mode and photo counting mode are 13% and 3%, respectively, while the corresponding parameters of an abroad SBUV-ICCD are better than 1%, and the scheme′s uncertainty is 1%.
    Kong Fanlin, Zhou Yue, Chen Xue, Sui Yongxin, Yang Huaijiang, Wen Gang. Measurement of Fatigue Properties of Solar-Blind Ultraviolet Intensified CCD[J]. Laser & Optoelectronics Progress, 2013, 50(11): 110401
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