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    Journals >Infrared Technology >Volume 42 >Issue 7 >Page 632 > Article
    • Infrared Technology
    • Vol. 42, Issue 7, 632 (2020)
    Estate Evaluation of Image Fault of Electric Power Fittings
    Xu LU1, Hanwu LUO1, Wenzhen LI1, Hailong ZHANG2, Qirui WU2, and Cheng LEI3
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  • 1[in Chinese]
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    DOI: Cite this Article
    LU Xu, LUO Hanwu, LI Wenzhen, ZHANG Hailong, WU Qirui, LEI Cheng. Estate Evaluation of Image Fault of Electric Power Fittings[J]. Infrared Technology, 2020, 42(7): 632 Copy Citation Text show less
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    LU Xu, LUO Hanwu, LI Wenzhen, ZHANG Hailong, WU Qirui, LEI Cheng. Estate Evaluation of Image Fault of Electric Power Fittings[J]. Infrared Technology, 2020, 42(7): 632
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