[1] Lee W J, Chun M H, Cheong K S. Solid State Phenomena, 2007, 124-126: 247.
[2] van der Marel C, Veerheijen M A, Tamminga Y. Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 2004, 22: 1572.
[4] Terada S, Murakami H, Nishihagi K. Thickness and Density Measurement for New Materials with Combined X-Ray Technique. Advanced Semiconductor Manufacturing Conference, 2001 IEEE/SEMI, IEEE, 2001. 125.
[5] Parrat L G. Physical View, 1954, 95(2): 359.
[7] Serafinczuk J, Pietrucha J, Schroeder G, et al. Optica Applicata, 2011, 41(2): 315.
[9] Gibaud A, Hazra S. Current Science, 2000, 78(12): 1467.
[10] Windover D, Armostrong N, Cline J P, et al. AIP Conference Proceedings, 2005, 788: 161.
[11] Luh D A, Miller T. Physical Review Letters, 1997, 79(16): 3014.
[12] Gil D L, Windover D. Journal of Physics D: Applied Physics, 2012, 45(23): 1.