We present a review of X-ray grating-based imaging based on interferometry, including the recent developments in instrumentation and methodology. The classic X-ray grating-based imaging based on Talbot-Lau interferometry is introduced in terms of its general principles and system configuration, as well as the multiple information (i.e., attenuation, refraction and small-angle scattering information) retrieval algorithms. Up-to-date analyses and optimizations of this method are presented, including approaches to relax the high positioning resolution requirement in phase stepping process and attempts on large-field-of-view imaging with high-resolution gratings. Secondly, we introduce the latest developments in two-dimensional grating-based imaging and time-resolved four-dimensional grating-based imaging. An outlook of X-ray grating-based imaging is given.