[1] Rao Y J,Jackson D A.Recent progress in fibre optical low-coherence interferometry.Meas.Sci.Technol.,1996,7;7:981～999

[2] Sorin W V,Gray D F.Simultaneous thickness and group index measurement using optical low-coherence reflectometry.IEEE Photon.Technol.Lett.,1992,4;1:105～107

[3] Diddans S,Diels J C.Dispersion measurements with white-light interferometry.J.Opt.Soc.Am.;B,1996,13;6:1120～1129

[4] Kasaya K,Yoshikani Y,Ishii H.Measurements of a semiconductor waveguide using a low-coherence interferometric reflectometer.IEEE Photon.Technol.Lett.,1996,8;2:251～253

[5] Wiedmann U,Gallion P.Leakage current measurement in multielectrode lasers using optical low-coherence reflectrometry.IEEE Photon.Technol.Lett.,1997,9;8:1134～1136

[6] Lambelet P,Fonjallaz P Y,Limberger H G et al..Bragg grating characterization by optical low-coherence reflectometry.IEEE Photon.Technol.Lett.,1993,5;5:565～567