AN Xi-bin, HE Bing, QIN Wei-wei, LIN Hao-shen, QIAN Xiao-jun. EKF for Nonlinear Relevance Systems with Random Measurement Loss[J]. Electronics Optics & Control, 2016, 23(10): 18

Search by keywords or author
- Electronics Optics & Control
- Vol. 23, Issue 10, 18 (2016)
Abstract

Set citation alerts for the article
Please enter your email address