• Opto-Electronic Engineering
  • Vol. 48, Issue 3, 200183 (2021)
Zheng Qilin, Wen Long, and Chen Qin*
Author Affiliations
  • [in Chinese]
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    DOI: 10.12086/oee.2021.200183 Cite this Article
    Zheng Qilin, Wen Long, Chen Qin. Research progress of computational microspectrometer based on speckle inspection[J]. Opto-Electronic Engineering, 2021, 48(3): 200183 Copy Citation Text show less

    Abstract

    Fast, accurate and nondestructive spectral analysis technique is important and widely used in the fields of scientific research, information, biomedical, pharmaceutical detection, agriculture, environment, and security. However, the existing spectroscopic analysis equipments are usually bulky and complex, which are difficult to adapt to portable application scenarios such as on-site rapid detection, light-load platform, etc. In recent years, miniature spectroscopic detection technology and equipment have received extensive attention, and have been rapidly developed, with significant advantages in size, weight, and power consumption. In particular, the computational spectral analysis technology based on the speckle detection can obtain high-precision spectral information by recording and analyzing the speckle pattern formed by the scattering element on the measured light. This paper will first introduce the related technical principles and technological developments, then analyze the existing techniques including the advantages and disadvantages, and finally discuss and summarize the future development direction and application prospects.
    Zheng Qilin, Wen Long, Chen Qin. Research progress of computational microspectrometer based on speckle inspection[J]. Opto-Electronic Engineering, 2021, 48(3): 200183
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