Approach for estimating the quality of fingerprint image captured by semiconductor sensors

[in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 33 >Issue 10 >Page 104 > Article

Opto-Electronic Engineering
Vol. 33, Issue 10, 104 (2006)

Approach for estimating the quality of fingerprint image captured by semiconductor sensors

[in Chinese] and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese]. Approach for estimating the quality of fingerprint image captured by semiconductor sensors[J]. Opto-Electronic Engineering, 2006, 33(10): 104 Copy Citation Text

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Abstract

[in Chinese], [in Chinese]. Approach for estimating the quality of fingerprint image captured by semiconductor sensors[J]. Opto-Electronic Engineering, 2006, 33(10): 104

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