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    Journals >Laser & Optoelectronics Progress >Volume 53 >Issue 9 >Page 93001 > Article
    • Laser & Optoelectronics Progress
    • Vol. 53, Issue 9, 93001 (2016)
    Simultaneous Measurement of Film Thickness and Mass Fraction by Raman Spectroscopy
    Wang Qin1、2、*, Zhao Chang1、2, Yang Huinan1、2, Su Mingxu1、2, and Cai Xiaoshu1、2
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop53.093001 Cite this Article Set citation alerts
    Wang Qin, Zhao Chang, Yang Huinan, Su Mingxu, Cai Xiaoshu. Simultaneous Measurement of Film Thickness and Mass Fraction by Raman Spectroscopy[J]. Laser & Optoelectronics Progress, 2016, 53(9): 93001 Copy Citation Text show less
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    Article index updated: May. 18, 2024
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    Wang Qin, Zhao Chang, Yang Huinan, Su Mingxu, Cai Xiaoshu. Simultaneous Measurement of Film Thickness and Mass Fraction by Raman Spectroscopy[J]. Laser & Optoelectronics Progress, 2016, 53(9): 93001
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