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    Journals >Acta Photonica Sinica >Volume 34 >Issue 4 >Page 628 > Article
    • Acta Photonica Sinica
    • Vol. 34, Issue 4, 628 (2005)
    Method to Enhance the Accuracy of Retardance Measurement of a Quarter-wave Plate
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Method to Enhance the Accuracy of Retardance Measurement of a Quarter-wave Plate[J]. Acta Photonica Sinica, 2005, 34(4): 628 Copy Citation Text show less
    References

    [5] Jones R C. A new calculation for the treatment of optical systems: Ⅰ; Ⅱ; Ⅲ. J O S A, 1941,31 (7) :488 ～ 503

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Method to Enhance the Accuracy of Retardance Measurement of a Quarter-wave Plate[J]. Acta Photonica Sinica, 2005, 34(4): 628
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