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    Journals >Opto-Electronic Engineering >Volume 31 >Issue 7 >Page 58 > Article
    • Opto-Electronic Engineering
    • Vol. 31, Issue 7, 58 (2004)
    A method for improving precision of profilometry with projecting grating
    [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. A method for improving precision of profilometry with projecting grating[J]. Opto-Electronic Engineering, 2004, 31(7): 58 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese]. A method for improving precision of profilometry with projecting grating[J]. Opto-Electronic Engineering, 2004, 31(7): 58
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