• Laser & Optoelectronics Progress
  • Vol. 60, Issue 15, 1514007 (2023)
Yuan Xu1, Shiqin Wei1, Pengfei Zhang1, Yao Wang1, Fang Wang1、2、*, and Yuhuai Liu1、2、3、4、**
Author Affiliations
  • 1National Center for International Joint Research of Electronic Materials and Systems, School of Information Engineering, Zhengzhou University, Zhengzhou 450001, Henan, China
  • 2Research Institute of Sensors, Zhengzhou University, Zhengzhou 450001, Henan, China
  • 3Zhengzhou Way Do Electronics Technology Co., Ltd., Zhengzhou 450001, Henan, China
  • 4Industrial Technology Research Institute Co., Ltd., Zhengzhou University, Zhengzhou 450001, Henan, China
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    DOI: 10.3788/LOP221705 Cite this Article Set citation alerts
    Yuan Xu, Shiqin Wei, Pengfei Zhang, Yao Wang, Fang Wang, Yuhuai Liu. Deep-Ultraviolet Laser-Diode Radiation Recombination Properties Based on Double-Concave Waveguide Layers[J]. Laser & Optoelectronics Progress, 2023, 60(15): 1514007 Copy Citation Text show less

    Abstract

    This paper proposes the use of double-concave waveguide layers for improving the radiative recombination characteristics of deep-ultraviolet (DUV) laser diodes (LDs). Simulation studies of four waveguide layer structures are performed using the Crosslight software. The results indicate that introducing a double-concave lower-waveguide layer improves the effective barrier height of the holes, effectively suppresses the leakage of holes from the multiple-quantum-well (MQW) region, and increases the concentration of carriers in the MQW region. The optimized structure enhances the radiative recombination rate and exhibits improved P-I characteristics and optical confinement factor, providing an effective solution for enhancing the performance of DUV LDs.
    Yuan Xu, Shiqin Wei, Pengfei Zhang, Yao Wang, Fang Wang, Yuhuai Liu. Deep-Ultraviolet Laser-Diode Radiation Recombination Properties Based on Double-Concave Waveguide Layers[J]. Laser & Optoelectronics Progress, 2023, 60(15): 1514007
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