[2] Ahi K[J]. Measurement, 138, 614(2019).
[3] Kowalski M, Kastek M[J]. IEEE Trans. Inf. Forensics Secur., 11, 2028(2016).
[5] Kowalski M, Kastek M, Walczakowski M, Palka N, Szustakowski M[J]. Appl. Opt., 54, 3826(2015).
[6] Angrisani L, Bonavolontà F, Cavallo G, Liccardo A, Schiano L M R[J]. Measurement, 116, 83(2018).
[7] Zaytsev K I, Karasik V E, Fokina I N, Alekhnovich V I[J]. Opt. Eng., 52, 68203(2013).
[8] Yousefi B, Sfarra S, Castanedo C I, Maldague X P V[J]. Infrared Phys. Techn., 85, 163(2017).
[11] Ding S H, Li Q, Li Y D, Wang Q[J]. Opt. Lett., 36, 1993(2011).
[13] Hou L, Han X W, Yang L, Shi W[J]. Chin. Phys. Lett., 34, 054207(2017).
[14] Valzania L, Feurer T, Zolliker P, Hack E[J]. Opt. Lett., 43, 543(2018).
[15] Rong L, Tang C, Wang D, Li B, Tan F, Wang Y, Shi X[J]. Opt. Express, 27, 938(2019).
[16] Maiden A M, Rodenburg J M[J]. Ultramicroscopy, 109, 1256(2009).
[17] Thibault P, Dierolf M, Bunk O, Menzel A, Pfeiffer F[J]. Ultramicroscopy, 109, 338(2009).
[18] Maiden A, Johnson D, Li P[J]. Optica, 4, 736(2017).
[19] Pfeiffer F[J]. Nat. Photonics, 12, 9(2018).
[20] Xiao J, Li D Y, Wang Y L, Shi Y S[J]. Acta Phys. Sin., 65, 154203(2016).
[21] Fienup J R[J]. Opt. Lett., 3, 27(1978).
[22] Fienup J R[J]. Appl. Opt., 21, 2758(1982).
[23] Sanz M, Picazo-Bueno J A, García J, Micó V[J]. Opt. Express, 23, 21352(2015).
[24] Zhang H, Bian Z, Jiang S, Liu J, Song P, Zheng G[J]. Opt. Lett., 44, 1976(2019).
[25] Li Y, Xiao W, Pan F, Rong L[J]. Chin. Opt. Lett., 12, 020901(2014).
[26] Pedrini G, Osten W, Zhang Y[J]. Opt. Lett., 30, 833(2005).
[27] Xie X F, Zhou J, Wu Q Z[J]. Journal of Computer Application, 30, 921(2010).