• Photonics Research
  • Vol. 4, Issue 3, 0115 (2016)
Leihong Zhang1, Dong Liang1, Bei Li1, Yi Kang1, Zilan Pan1, Dawei Zhang2、*, and Xiuhua Ma3
Author Affiliations
  • 1College of Communication and Art Design, University of Shanghai for Science and Technology, Shanghai 200093, China
  • 2School of Optical Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
  • 3Shanghai Institute of Optics and Fine Mechanics, CAS, Shanghai 201800, China
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    DOI: 10.1364/prj.4.000115 Cite this Article Set citation alerts
    Leihong Zhang, Dong Liang, Bei Li, Yi Kang, Zilan Pan, Dawei Zhang, Xiuhua Ma. Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector[J]. Photonics Research, 2016, 4(3): 0115 Copy Citation Text show less
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    [11] L. H. Zhang, D. Liang, Z. L. Pan, X. H. Ma. Study on the key technology of reconstruction spectral reflectance based on the algorithm of compressive sensing. Opt. Quantum Electron., 47, 1679-1692(2015).

    [12] D. Y. Tzeng, R. S. Berns. A review of principal component analysis and its applications to color technology. Color Res. Appl., 30, 84-98(2005).

    [13] H. S. Fairman, M. H. Brill. The principal components of reflectances. Color Res. Appl., 29, 104-110(2004).

    Leihong Zhang, Dong Liang, Bei Li, Yi Kang, Zilan Pan, Dawei Zhang, Xiuhua Ma. Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector[J]. Photonics Research, 2016, 4(3): 0115
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